edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 25 NO. 3 30 ABOUT THE AUTHORS Frieder H. Baumann, a native of Namibia, studied physics in Bielefeld and Goettingen, Germany, where he earned his master’s degree and Ph.D. in physics from the University of Goettingen. He was a principal investigator for 14 years at Bell Laboratories in New Jersey, focusing on advanced electron microscopy, process simulation, and optical MEMS design and fabrication. After Bell Labs, Baumann joined Philips Semiconductors in Hamburg, Germany, leading the process and device simulation efforts for discrete bipolar devices. Since 2006, he has been a senior engineer in IBM’s microelectronics division in East Fishkill, N.Y., and worked on device characterization and physical failure analysis using advanced electron microscopic techniques. Baumann is currently a principal member of technical staff at GlobalFoundries in Malta, N.Y. Brian Popielarski started in the industry working in failure analysis 10 years ago. Currently, he is a senior engineer at GlobalFoundries focused on advanced characterization, silicon photonics, and package-level failure analysis. Ryan Sweeney is currently a senior member of the technical staff at GlobalFoundries. Since joining GlobalFoundries in 2012, Sweeney has worked within the failure analysis department, leading root cause engineering analysis on production level technologies ranging from 14 nm FinFET to 32 nm SOI and development level technologies including 7 nm FinFET and 45 nm silicon photonics. Prior to joining GlobalFoundries, he worked at Micron Technology as an engineer performing failure analysis on multiple NAND and DRAM technology nodes. Sweeney graduated from Rochester Institute of Technology with honors with a bachelor’s in microelectronic engineering in 2008 and from University at Albany with an MBA in finance in 2021. Felix Beaudoin has more than 20 years of experience in failure analysis research and in yield analysis of microelectronic circuits for technology development and volume manufacturing. He obtained a Ph.D. in electronics from the University of Bordeaux, France. Currently he is principal member of technical staff at GlobalFoundries, supporting yield engineering activities on 12 nm FinFET and planar technology production including silicon photonics. Ken Giewont currently works at GlobalFoundries in Malta, N.Y. as a fellow in the technology and innovation organization, leading the development of GF’s silicon photonics foundry offerings. Previously, he worked at IBM Microelectronics as a process integration engineer developing and manufacturing leading edge CMOS technologies. He earned a bachelor’s in engineering science from Penn State University in 1984 and a master’s in electrical engineering from Syracuse University in 1990. FAILURE ANALYSIS OF PHOTONIC INTEGRATED CIRCUITS (continued from page 27) 5. Y. Bian, et al.: “Towards Low-loss Monolithic Silicon and Nitride Photonic Building Blocks in State-of-the-art 300 mm CMOS Foundry,” FW5D.2, Frontiers in Optics 2020, 14–17 September 2020. 6. J. Ayala, et al.:“Integrating a High Performance Ge Photodiode into a CMOS Compatible Flow for a Full Monolithic Silicon Photonics solution,” 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 6-9 May 2019. 7. K. Giewont, et al.: “300-mm Monolithic Silicon Photonics Foundry Technology,” IEEE J. of Select Topics in Quantum Electronics, 25(5), p. 1-11, 2019. 8. Y.Y. Wang, J. Nxumalo, et al.: “Optical Modulator P/N Junction Map- ping by Electron Holography and Scanning Capacitance Micros- copy,” Proceedings of Microscopy and Microanalysis 2018, 24, Suppl 1, 1 August 2018. 9. H. Stuart, F.H. Baumann, and A. Wong-Foy: “Monolithic Integration of Optical Waveguides and MEMS-based Switching in Silicon-oninsulator,” Micromachining Technology for Micro-Optics and NanoOptics II, Proceedings of SPIE, 5437, 2003. 10. B. Peng, et al.: “A CMOS Compatible Monolithic Fiber Attach Solution with Reliable Performance and Self-alignment,” TH3l.4, 2020 Optical Fiber Communications Conference (OFC), 6-10 March 2020.
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