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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 23 NO. 1 46 “Hybrid-pixel electrondetectors byDectris bring count- less opportunities for materials science TEM and STEM applications, such as 4DSTEM, from increased instrument throughput to reduced total cumulative electron dose,” stated Dr. Christian Broennimann, CEO of Dectris. “The synergy betweenGatan andDectriswill bring our technol- ogy to the thriving electron microscopy market.” “I am very pleased by this agreement, as their hybrid- pixel electron detectors truly complement our current portfolio and unified workflows within Gatan Microscopy Suite,” commented Narayan Vishwanathan, VP and busi- ness unit manager of Gatan. “With this new camera, we are now able to offer our researchers complete, efficient workflows to perform advanced, high speed, and high- quality 4D STEM diffraction studies.” For more information, visit gatan.com. NITROGEN-VACANCY MAGNETOMETRY DEVELOPMENTS Horiba and Qnami have agreed to work together to accelerate their developments to address the growing need to apply cutting edge technology to the quantitative and non-perturbative analysis of surface magnetic fields. The cooperationwithBasel, SwitzerlandbasedQnami, which specializes in quantumsensing andNVmagnetom- etry, will cover three main areas: product development, supply, anddistribution of the first generation of quantum microscopes, as illustrated by the newly launched Qnami ProteusQ. Horiba and Qnami will continue their joint research in quantum atomic force microscopy (AFM), capitalizing on their complementary core competencies in the fields of near field optics and materials sciences: surface analysis and nanoscopy, diamond-based quantum sensing, and magnetometry. Horiba will supply Qnami with core AFM components necessary tomeet the demand for Qnami ProteusQmicro- scopes, andwill become the exclusive global distributor of the ProteusQ through an established network of affiliates inEurope, China, Japan, the rest of Asia, and the Americas. PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG GATAN AND DECTRIS ANNOUNCE JOINT SALES AND SERVICE AGREEMENT FOR THE STELA CAMERA Gatan andDectris have signed a joint sales and service agreement pertaining to the use of Dectris technology in Gatan’s new Stela camera. Within this agreement, Gatan has fully integrated a Dectris hybrid-pixel electron detec- tor within the Gatan Microscopy Suite platform and now offers a completeworkflowfor advanced four-dimensional scanning transmission electron microscopy (4D STEM) diffraction. Known as the Stela camera, it will enable the mainstreamadoptionof the4DSTEMdiffraction technique in electron microscopy labs around the world. During the study of mate- rial structures, researchers frequently use STEM to focus an electron probe (from a few nanometers down to sub- atomic dimensions) onto the specimen to collect various signals as the electrons inter- act with and scatter from the sample. 4D STEM diffraction is an advanced technique in which the probe is rastered across the specimen in a two- dimensional (2D) array. At each probe position, a 2D dif- fractionpattern is imagedon a pixelated detector, generating a 4D data cube that can be analyzed further. A successful 4D STEM study primarily relies on robust and easy-to-use software for data acquisition andanalysis, as well as high data quality and acquisition speed that is mainly determined by the detector used to collect the diffraction patterns. This collaboration between Gatan and Dectris will bring all these aspects together in a single package that enables researchers at all levels to access this critical experimental method. Gatan Stela hybrid pixel electron detector with STEMx.