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edfas.org 37 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 23 NO. 1 2021 EDFAS AWARDS SEEKING NOMINATIONS FOR EDFAS AWARDS The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. The awards will be given at ISTFA 2021. Nominate a worthy colleague today! EDFAS LIFETIME ACHIEVEMENT AWARD The EDFAS Lifetime Achievement Award was established by the EDFAS Board of Directors in 2015 to recognize leaders in the EDFAS community who have devoted their time, knowledge, and abilities to the advancement of the electronic device failure analysis industry. EDFAS PRESIDENT’S AWARD The EDFAS President’s Award shall recognize exceptional service to EDFAS and the electronic device failure analysis community. Examples of such service include, but are not limited to committee service, service on the Board of Directors, organization of conferences or symposia, development of education courses, student and general public outreach. While any member of EDFAS is expected to further the Society’s goals through service, this award shall recognize those who provided an exceptional amount of effort in their service to the Society. Nomination deadline for both awards is March 1, 2021. For rules and nomination forms, visit the EDFAS website at edfas.org, click on Membership & Networking and then Society Awards, or contact Mary Anne Jerson at 440.671.3877, maryanne.jerson@asminternational.org. In 2017, she joined Zeiss in her current role as solutions manager for x-ray microscopy and Crossbeam laser products. Cheryl holds 15 patents, has won three Best Presentation awards, and has authored over 65 publications including book chapters. As a long-time EDFAS member, she served in over 21 different positions including ISTFA General Chair and EDFAS President. Please join me in thanking Philippe Perdu and Cheryl Hartfield, FASM, for their significant contributions to invent- ing improved industry techniques and providing key research and education to benefit the FA community. To con- tinue the recognition of worthy contributors, I urge you to send suggestions to consider for next year’s awards to me at Knauss_Lee@bah.com. To learn more, visit asminternational.org/web/edfas/societyawards. NOTEWORTHY NEWS 2021 ESREF The 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021) will take place virtually, October 4-8. The event will be hosted by the IMS laboratory, University of Bordeaux in collaboration with LAAS-CNRS, University of Toulouse – Bordeaux. This international symposium continues to focus on recent developments and future directions in failure analysis, quality and reliability of materials, and devices and circuits for micro, nano, and optoelec- tronics. It provides the leading European forum for developing all aspects of reliability management and innovative analysis techniques for present and emerging semiconductor applications. For more information, visit esref2021.sciencesconf.org.