February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 23 NO. 1 36 EDFAS AWARD WINNERS: RECOGNIZING INDUSTRY PIONEERS AND LEADERS Lee Knauss, Chair, EDFAS Awards and Nominations Committee Immediate Past President, EDFAS Knauss_Lee@bah.com The ASM Electronic Device Failure Analysis Society established two awards to recognize the accomplishments of its members. I am pleased to highlight the 2020 winners. The EDFAS Lifetime Achievement Award recognizes those who have given their time, knowledge, and abilities toward the advancement of the electronic device failure analysis industry. The 2020 awardee is Philippe Perdu, senior expert at ANADEF/CNES in France. His citation reads: “for his career-long technique development, wholehearted service to themicroelectronic failure analysis community, tireless mentoring for students and young engineers, and relentless pursuit of tool adaptation for microelectronics applications including integrated circuits, microsystems, systemon chip, and 3D-integrated packaging.” Philippe Perdu was a senior expert in microelectronics at CNES from 2002 to 2018 and he led the VLSI Failure Analysis CNES laboratory from 1988 to 2016. His main activity has been to develop techniques and adapt tools for electronic components dedicated to space applications, mostly concerning the FA process (defect localization). Philippe served as a boardmember of EDFAS, and as a member of the ISTFA organizing committee from 2005 to 2014, serving as technical chair in 2010, and general chair in 2012. He has been a EUFANET (European Failure Analysis NETwork) board member, associate editor of EDFA magazine, an editorial advisory boardmember of Microelectronics Reliability, and on the steering committee for ESREF, serving as vice chair in 2015. His other activities include providing support to space projects (failure analysis at the system/board/component level), to drive expertise roadmap (tooling), and to set up R&D programs related to VLSI expertise and reliability, to coach, train, and supervise teams dedicated to these activities. The EDFAS President’s Award recognizes those who provided an exceptional amount of effort in their service to the Society. The 2020 awardee is Cheryl Hartfield, FASM, solutions manager, x-raymicroscopy at Zeiss. She is cited “for being a passionate advocate for EDFASmembers and providing consistent leadership and service to the society through all its cycles, initiatives, and transformations for over 20 years.” Cheryl Hartfield worked in materials characterization, packaging development, and lab management for 12 years at Texas Instruments. She was elected as senior member technical staff for pioneering physical characterization techniques that became industry standards and leading large taskforce teams to solve chip-package interaction challenges at the beginning of the Cu/low-k era. Cheryl co-founded Omniprobe, which in 2011 was acquired by Oxford Instruments. She led applications and product marketing and became Omniprobe business manager after the acquisition. In 2016, she introduced the world’s first commercial cryo-manipulator for cryoFIB. 2020 EDFAS AWARD WINNERS Philippe Perdu received the 2020 EDFAS Lifetime Achievement Award. Cheryl Hartfield is the 2020 EDFAS President’s Award winner.