February_EDFA_Digital

edfas.org 1 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 23 NO. 1 DEPARTMENTS Applied FA Tools and Techniques Toward IC Trust and Assurance Adam G. Kimura, Adam R. Waite, Jonathan Scholl, and Glen D. Via Traditional post-fabrication testing procedures are not enough to cover the full verification space when trying to arrive at a confidence level of assurance of an un- trusted chip. Author Guidelines Author guidelines and a sample article are available at edfas. org. Potential authors should consult the guidelines for useful information prior to manuscript preparation. 4 12 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS FEBRUARY 2021 | VOLUME 23 | ISSUE 1 edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS 2 GUEST EDITORIAL Joe Versaggi 10 EDUCATION NEWS Felix Beaudoin 1 1 CALL FOR PAPERS 36 2020 EDFAS AWARD WINNERS 37 2021 EDFAS AWARDS 39 BOARD OF DIRECTORS NEWS R enee S. Parente 40 CALL FOR NOMINATIONS Lee Knauss 41 DIRECTORY OF FA PROVIDERS Rosalinda Ring 43 TRAINING CALENDAR Rosalinda Ring 45 LITERATURE REVIEW Mike Bruce 46 PRODUCT NEWS Ted Kolasa 50 GUEST COLUMNIST David Grosje an 52 ADVERTISERS INDEX Finding Shorted Components on PCBs by IR-Based DC Injection Method Zhifeng Zhu and Garron K. Morris An infrared-based, direct current injectionmethod requires very fewaccessiblemeasurement points and is a low-cost, nondestructive way to identify failures in modern printed circuit board assemblies. 22 For the digital edition, log in to edfas.org , click on the “News/Magazines” tab, and select “EDFA Magazine.” Using an Atmospheric Oxygen-Only Plasma for Decapsulation of Packages Lea Heusinger-Jonda, Jiaqi Tang, and Kees Beenakker A recently developeddecapsulationmethoduses the efflu- ent of an atmospheric oxygen-only plasma for root cause failure analysis of complex semiconductor structures. 12 4 22 29 FA of Resistive RAM in a Convolutional Neural Network for Image Classification Nagaraj Lakshmana Prabhu and Nagarajan Raghavan The computational performance of a CNN is intense and a significant amount of investigation and architectura l evolution of the network for accuracy improvement has been carried out. 29 ABOUT THE COVER Compositionmapof a photo resist particle caught betweenAl metal lines and subsequently experiencingpyrolysis. Photoby Wentao Qin, ON Semi, False Color, 2020 EDFAS Photo Contest. EDFAS Virtual Workshop Photo Gallery A visual recap of the EDFAS Virtual Workshop held in December 2020. 34