November_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 4 48 Even more sensitive piezoelectric materials can take advantage of the small voltages generated by extremely small mechanical displacement, vibration, bending or stretching to power miniaturized devices, for example biosensors embedded in the human body, removing the need for an external power source. The study, “Liquid metal-based synthesis of high per- formance monolayer SnS piezoelectric nanogenerators,” was published in Nature Communications in July 2020. For more information, visit fleet.org.au . powerful measurement and analysis capabilities can be utilized with EasyEXPERT software and over 300 built‐in application tests (measurement library) on its embedded Windows 10 platform. The EasyEXPERT can be operated through an intuitive GUI froma 15‐inchwide touch screen ormouse/keyboard. Its powerfulmeasurement andanaly- sis capabilities makes it a superior characterization solu- tion for a wide range of electrical characterizations and evaluations for device, material, semiconductor, active/ passive component, and other electric devices. The B1500A supports variousmodules and allows con- figuration up to 10 slots. Standard SMU modules enable to performvarious IVmeasurements such as spot, sweep, samplingmeasurements. Moreover, quasi-staticCV (QSCV) measurement is also supported by SMU. Multi-frequency capacitancemeasurement unit (MFCMU)modules support capacitance measurement and easy IV/CV switching with the optional SCUU. The waveform generator fast measurement unit (WGFMU) module enables ultra-fast pulsed IV and dynamic IV measurement for cutting-edge applications based on arbitrary waveform sourcing and fast digitizingmeasurement capabilities. The combination of these modules cover various applications of semicon- ductor devices. For more information, visit keysight.com . Output voltage in a practical, wearable device; voltage output during tensile bending and relaxing (two-electrode device). B1500A SEMICONDUCTOR PARAMETER ANALYZER CONTINUES LEGACY OF POWERFUL DEVICE CHARACTERIZATION TOOLS Since Keysight (then part of Hewlett Packard) intro- duced the world’s first digital parameter analyzer, the 4145A, in the early 1980s, Keysight has been a leading producer of semiconductor parameter analyzers, and has continued to release parameter analyzers with many enhancements. Today, Keysight introduces the B1500A as a successor of the de‐facto standard Keysight 4155/4156 series. The B1500A expands themeasurement capabilities fromDC‐IV toCV, QS‐CV, pulsegenerationand fast pulsed IV measurements tomeet advanced characterization needs. The B1500A’smodular architecture provides configurabil- ity and expandability according to application needs. The The Keysight B1500A semiconductor device parameter analyzer.