August_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 3 44 He also acted as User Group co-chair for ISTFA 2018 and 2019 and is User Group chair for ISTFA 2020. Vision Statement “After years of attending ISTFA and serving as a vol- unteer, I realize the major focus of these conferences is on the failure analysis of advanced digital circuits. Tool development and discussion on analog circuits failure analysis is very limited. Many of the techniques and tool parameters that are useful for digital circuits may not be useful for failure analysis on analog circuits. I have some suggestions for how to encourage more vendor involve- ment and support future technology development. One obvious difference between digital and analog circuit failure analysis is that digital circuits work at lower voltages while analog circuits’ working voltage can range from few volts to 100s of volts and load current of 100s of Ampere. Electrical bench equipment needed for conducting analysis on an analog circuit is different from digital circuits. Inviting vendors who offer solutions for this high-power equipment will benefit both analog FA engineers and EDFAS. Many analog technologies aremultiple-well technolo- gies (switching at high voltage) to reduce leakage current between different circuits, so the standard techniques of EOP/EOFM to monitor switching transistors don’t give correct results. Signals displayed by the tool are either saturated because of high voltage switching or are dis- torted because laser must pass through several switching diffusionbefore it reaches transistor of interest. Toconduct successful FA on these technologies, we need to update the existing technique or develop a new technique. To summarize, based on learning and observations from my volunteer work at ISTFA, and as an analog FA expert, I believe I can help EDFAS increase its analog FA technical content to attract more analog FA engineers, increase vendor attendance offering solutions for analog FA techniques, and help create FA tool roadmap for ana- log circuits.” Rose Ring is an innovative self- motivated professional with a “can do” attitude and ability to define and solve issues in collaborative environment. She led, directed, and supervised teams of engineers and technicians in providing wafer and package-level failure analysis support in start-up, development, andhigh-volumemanu- facturing environments. She is also skilled at working in a multicultural environment. Her experience includes workingwithmajor foundries andpartners andplaying an integral role in cross-functional teams that helped com- panies pass customer audits and receive a high approval rating in quality and operations. She successfully assisted assembly sites and outsourcing suppliers in Asia and the U.S. topass customers’ quality assessmentswhile increas- ing production capacity during high-demand seasons, thus growing sales and revenue. Ring’s qualifications include: Playing a significant role as a new product introduction (NPI) and technology transfer engineer for Intel (Cu/90 nm) andGF-IBMAlliance (20 nm) and 14 nm engineering technology point of con- tact; serving as key scientist on metrology and FA tools and techniques development, including mentoring and developing recipes and BKMs, and providing tutorials to engineers and technicians; andAMDandGlobalFoundries’ engineering ambassador to various universities and colleges. She holds 47 patents on various FA-related sub- jects (Ga Probe, FIB/SEM GIS, Circuit Edit, and EBIC Endpointing Mechanism). During her career in semicon- ductor failure analysis, she worked as staff FA engineer at Kionix Inc., staff FA engineer at Qorvo Inc., MTS/FA engineer at GlobalFoundries Inc., FAmanager at Standard Microsystems Corp., and low yield analysis engineer and lab manager at Intel Corp. Ring is an energetic force and has used her positive attitude and tireless energy in serving EDFAS in various roles, including editor of EDFA magazine (2008 – 2011), EDFA associate editor (2000 topresent), session chair (2000 to present), International Symposium for Testing and Failure Analysis (poster, tutorial, case histories sessions). These experiences enabled her to personally meet many prominent representatives of worldwide FA community and get closely familiar with leading-edge technology FA research and achievements. Vision Statement “I believepassionately in thepower of sharing informa- tion andbuilding individuals through education. We strive to offer conferences and magazine content that appeal to the devoted failure analysts striving to enhance their skills and learn about the latest equipment, as well as professionals and academics who want to keep up with our dynamic field. Everything EDFAS does is driven by this goal: How can we best serve our constituency and help them excel in their jobs and careers?”