August_EDFA_Digital

edfas.org 43 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 3 Renee S. Parente has been affiliated with AMD since 1995. She is currently a business operations manager in the Foundry Technology Organization in Austin, Texas, where she plays a critical dual role as a business operations leader and organizational development leader. She is responsible for capital assetmanagement, financial forecast, R&D organization development management , and employee engagement activities. Parente is a strong believer in building a community through industry involvement and volunteerism. She is returning as AV chair for ISTFA this year. In past years, she has servedon the ISTFAorganizing committee as thepanel co-chair and as member of the attendee committee and microscopy review committee. Parente also hosted mul- tiple EDFAS Lonestar Chapter meetings for her organiza- tion and held the co-lead position on the AMD Technology Showcase organizational committee. She is the site lead for Austin AMD Women’s Forum and vice-chair for AMD Austin Community Affairs Council. Parente has 20 years of semiconductor process charac- terization anddevice analysis laboratory experience. Most recently, shewas the AMD Austin Device Analysis lab’s site leadandPhysical Failure Analysismanager responsible for lab safety, PFA tools, and technique development. Prior to roles in management, she was a member of the technical staff and worked as an individual contributor in various physical analysis labs within AMD and within its Motorola Alliance. Parente also was her company’s corporate rep- resentative on the SEMATECH ICFAC Council (Integrated Circuit Failure Analysis Council) and served on the PIFAC Council (Package and Interconnect Failure Analysis). She received her bachelor’s degree in biochemistry from Rutgers University in 1994. Vision Statement “I would love to see more failure analysis engineers participate in EDFAS. The FA community is small and we must all take ownership and do our part to improve it. My personal goals are to make EDFAS and the ISTFA event accessible to more individuals and to increase the individual participation rate in the conference, whether it be on a review committee, organizational committee , or as a paper tutorial contributor. EDFAS could help our members justify conference attendance by enabling their involvement with our society. I believewe should strive to keep EDFAS in the forefront of the failure analysis world and increase the sessions for emerging talent. EDFAS should continue to be the society people think of first as a source of failure analysis innovation sharing, training, and networking.” James “Jim” Colvin comes from the Midwest and holds an electrical engineering degree from Purdue University. He has 30 years of contri- butions to the failure analysis com- munity through committee orga- nizations for ISTFA, EOS/ESD, IPFA and IRPS and has published more than 20 award-winning papers on failure analysis tech- niques. Colvinhasworked as a consultant for over 27 years and originated the Passive Voltage Contrast (PVC) tech- nique, the first portable emission microscope, the vibra- tion coupler, and the laser illuminator, to name a few. The PVC technique is still used through the industry today. Currently he is the CEO of FA Instruments Inc., a company founded to provide leading edge tools for failure analysis. Colvin currently holds 15 patents for products relating to the semiconductor field and is recognized as a contribu- tor to the advancement of semiconductor technologies. He has served as moderator of the ISTFA Sample Prep Users Group since 2018. In addition, Colvin is a frequent presenter at ISTFA and has published nearly 20 articles, including articles and guest editorials in EDFA magazine. Vision Statement “Bridging the gap between management and failure analysis only happens with communication. ISTFA and EDFAS are important forums to highlight the value of problem solving and its ‘cost.’ The horrible cost in low yields and returns for not having failure analysis far out- strips the cost of having competent FA resources.” Tejinder Gandhi works as a senior principal member of technical staff (failure analysis) at Maxim Integrated in San Jose. He has been in the field of failure analysis since 2005 being employed at Texas Instruments, National Semiconductor, and Power Integrations. Gandhi is an active volunteer in EDFAS. He was editor- in-chief for the 7th edition of the EDFAS Microelectronics Failure Analysis Desk Reference. In that role, he developed the outline and created processes for paper submissions and peer review and directed nine editors and nearly 100 contributors.