May_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 2 52 Visit the Electronic Device Failure Analysis Society website edfas.org Accelerated Analysis............................................. 52 Allied High Tech. ..............................................26-27 ASM International................................................... 9 Checkpoint.......................................................14-15 Hamamatsu............................................................. 3 TESCAN USA Inc...........................Inside front cover Quantum Focus............................ Inside back cover ULTRA TEC...............................................Back cover For advertising information and rates , contact: Kelly Johanns, Business Development Manager 440.318.4702, kelly.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/mediakit. INDEX OF ADVERTISERS A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis , contact Kelly Johanns, Business Development Manager, 440.318.4702, or kelly.johanns@asminternational.org Current rate card may be viewed online at asminternational.org/mediakit. 2020 IEDM The 66th International Electron Devices Meeting (IEDM) will be held December 14-16 at the Hilton San Francisco Union Square. IEDM is a leading forum for reporting breakthroughs in the technology, design, manufacturing, physics, and modeling of semiconductors and other electronic devices. Topics of interest include circuit and device interactions; characterization, reliability, and yield; compound semicon- ductor and high speed devices; memory technology; modeling and simulation; nano device technology; optoelectronics, displays, and imagers; power devices, process and manufacturing technology, and sensors, MEMS, and BioMEMS. IEDM is sponsored by the IEEE Electron Devices Society. For more information, visit ieee-iedm.org . NOTEWORTHY NEWS