May_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 2 50 2020 ITC The International Test Conference (ITC) will be held November 3-5 at the Washington Marriott Wardman Park, in D.C. ITC is the world’s premier conference dedicated to the elec- tronic test of devices, boards, and systems covering the complete cycle fromdesign verifica- tion, test, diagnosis, failure analysis, and back to process and design improvement. At ITC, test and design professionals will confront the challenges the industry faces and learn how these issues are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. ITC, the cornerstone of TestWeek events, offers awide variety of technical activities targeted at test and design theoreti- cians and practitioners. The conference includes formal paper sessions, tutorials, panel sessions, case studies, a lecture series, commercial exhibits and presentations, and a host of ancillary professional meetings. ITC is sponsored by the IEEE. For more information, visit itctestweek.org . NOTEWORTHY NEWS