May_EDFA_Digital

edfas.org 43 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 2 SOM, mechanical polishing, chemical decapsulation; TEM sample preparation, mechanical polishing, FIB, and sputter coating of sample (Au or Cr). LIBERTY LABORATORIES 484 Vista Way Milpitas, CA 95035 408.262.6633 sales@libertylab.com libertylab.com Services Offered: Reliability services, ESD and latch- up, ATE testing, analytical services on demand, failure analysis, competitive teardown, counterfeit analysis, construction analysis, turnkey FA, electrical FA, physical FA, and microscopy. Tools and Techniques: Optical microscopy, curve-trace (manual and automated), emission microscopy (EMMI), fluorescent micro-thermal imaging with lock-in (FMI), laser stimulation microscopy, near infrared, scanning optical microscope (SOM), backside and frontside, time domain reflectometry (TDR), circuit edit FIB (FIB-EDIT), 3D x-ray tomography, C-scanning acoustic microscopy (C-SAM), decapsulation, FIB-SEM cross sectioning, field emission, scanning electron microscopy (FE-SEM), mechanical cross-sectioning, parallel lapping, focused ion beamwith scanning electronmicroscopy (FIB-SEM), high resolution optical microscopy, STEM, TEM, and ultra-high resolution-SEM. MATERIALS RESEARCH LABORATORIES INC. 290 North Bridge St. Struthers, OH 44471 800.424.1776 info@mrllab.com mrllab.com Services Offered: Materials/surface analysis services and failure analysis. Tools and Techniques: X-ray photoelectron spectroscopy (XPS/ESCA), ISS, high-resolution scanning auger micros- copy (SAM), SEM, TEM, SAED, EDS, infrared spectroscopy/ microscopy (FTIR/microFTIR), laser Raman spectroscopy/ microscopy (LRS/microLRS), ultraviolet/visible/near infra- red spectroscopy (UV/VIS/NIR), RGA, metallography, light microscopy, gas/liquidchromatography, ionchromatogra- phy, physical testing (tensile/shear) and XRD, WDS, STEM, AFM, STM, emission spectroscopy (DCP/ICP), XRF, atomic absorption spectroscopy, gas/liquid chromatography/ mass spectroscopy (GC/LC/MS), thermal analysis (DSC/ DTA/TGA), NMR, SIMS/LIMS, and ToFSIMS. METALLURGICAL ENGINEERING SERVICES INC. 845 E. Arapaho Rd. Richardson, TX 75081 972.480.0033 sales@metengr.com metengr.com ServicesOffered: Mechanical, metallurgical, nondestruc- tive, failure and chemical analysis, expertwitness services, and onsite investigation. Tools and Techniques: Bend testing, drop weight tear test, flexural testing, fracture toughness, hardness testing, micro hardness, shear testing, tensile testing, abrasion testing, adhesion testing, stereo microscopy, corrosion testing, dye penetrant, eddy current testing, guidedwave ultrasound, magnetic particle, portable hardness, strain gauge testing, ultrasonic flaw inspection, visual inspec- tion, x-ray, weld inspection, surface analysis, FTIR, and scanning electron microscopy. MICHIGAN METROLOGY LLC 17199 N. Laurel Park Dr. #51 Livonia, MI 48152 734.953.5030 info@michmet.com michmet.com/index.htm Services Offered: 3D surface roughness measurements, contract measurements, surface texture analysis, and measurement consulting, training, and classes. Tools and Techniques: NPFlex 3D optical profiler vertical scanning interferometer technique, and phase shifting interferometer mode. MICROLABS SCIENTIFIC LLC 100 Burtt Rd., Suite 125 Andover, MA 01810 978.409.2812 contact@microlabsscientific.com microlabsscientific.com ServicesOffered: Analytical services, consulting services, and failure analysis services. Tools and Techniques: Failure analysis, optical profilom- etry, thermal imaging, film thickness measurements, optical microscopy, SEM, EDS, FIBmilling, vibrationmea- surements, and consulting (MEMS testing, MEMS process integration, failure analysis, yield improvement, project management). NERSIC MATERIAL TESTING, ANALYTICAL CHARACTERIZATION AND CONSULTING LABORATORY Chemistry Department, University of Waterloo 200 University Avenue West Waterloo, Ontario, Canada N2L3G1 877.819.8786 sales@nersic.com nersic.com Services Offered: Analytical services, consulting and training services, corrosion, contamination, defect analy- sis, elemental maps, delamination, and depth profiling. Tools and Techniques: Atomic force microscopy, ATR- FTIRmicroscope, correlativemicroscopy, electrochemical station, energy-dispersive x-ray spectroscopy on SEM, FE-SEM and environmental SEM, FIB-SEM, NMR, Raman microscopy, scanningaugermicroscopy, SIMS, TEM, STEM, XPS (ESCA), and XRD (powder and thin film).