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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 22 NO. 2 42 DIRECTORY OF INDEPENDENT FA PROVIDERS Rose M. Ring, Howard Hughes Research Lab LLC jm4papa@yahoo.com E lectronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. ADVANCED CIRCUIT ENGINEERS 308 S. Abbott Ave. Milpitas, CA 95035 408.719.1617 sales@advancedcircuitengineers.com advancedcircuitengineers.com ServicesOffered: Electrical failureanalysis, FIB front-side/ back-side circuit edits, material characterization, physical failure analysis, and sample preparation. Tools andTechniques: SEM/EDS, SEM/FIBdual beam, FIB cross-section, EBSD, TEM sample preparation, HRTEM, STEM(BF,MAADF, HAADF), EDS, EELS, electronholography, and tomography. ADVANCED MICROANALYTICAL 50A Northwestern Dr., Unit #4 Salem, NH 03079 877.605.6662 603.898.7074 advancedmicroanalytical.com ServicesOffered: Comparative testing lab, compositional analysis, destructive physical analysis, environmental monitoring, failure analysis, fire investigative/combustion byproduct, inspection services, integrated circuit support, materials characterization, nanomaterials, nondestructive testing, particle testing, particulatemicroanalysis, product development R&D, product/process validation, quality assurance, and unknown material identification. Tools and Techniques: CSAM, EBSD, EDS/elemental mapping, FIB-SEM, GC/GC-MS, GD-OES, hardness/micro- hardness testing, ICP-MS & ICP-OES, micro-FTIR, micro- Raman, NMR, opticalmicroscopy, particle sizedistribution, physical/mechanical testing, SEM, surface profiling, TEM, x-ray photoelectron spectroscopy, x-ray imaging/3D x-ray CT, XRD, and XRF. ADVANCED SURFACE MICROSCOPY 3250 N. Post Rd., Suite 120 Indianapolis, IN 46226 317.895.5630 800.374.8557 info@asmicro.com wp.asmicro.com Services Offered: Independent analytical testing and contract research, magnification calibration specimens and traceable standards, image analysis software, AFM consulting and training, and repair service and parts. Tools and Techniques: Digital instruments NanoScope IIIa, with Dimension 3100 large sample stage and phase extendermodule. Phase imaging, tapping in liquid, surface potential, electric/magnetic field gradient, forcemodula- tion, nano-indentation and nano-scratching and force volume imaging, Veeco/digital instruments NanoScope IV with Dimension 3100 AFM and a full set of electrical applicationmodules including scanning capacitance and conductive AFM (TUNA, C-AFM, SSRM) covering the current range from picoamps to 10s of microamps (pA to µA). CERIUM LABS 5204 East Ben White Blvd. Bldg. 1, Mailstop 512 Austin, TX 78741 512.691.7752 866.770.7752 sales@ceriumlabs.com ceriumlabs.com Services Offered: Manufacturing support, raw materials qualification, and advanced materials research. Tools and Techniques: AFM, ATD-GC-MS, ERDA, FIB, FTIR, IC, HR-ICP-MS, VPD-ICP-MS, ICP-OES, NAA, NRA, PIXE, Raman spectroscopy, RBS, SEM/EDS, SIMS, TEM/STEM, EDS/EELS, TXRF, TOC, XPS-ESCA, and XRD-XRR. INSCOPE LABS PTE. LTD. 28 Ayer Rajah Crescent, #03-01 Singapore 139959 +65 6779 3735 sales@inscopelabs.com inscopelabs.com Services Offered: Analytical and electron device failure analysis (electrical localization, material analysis, sample preparation). Tools and Techniques: Scanning optical microscopy, multi-laser NIR scanning optical microscope, 1064 nm laser (capable of electron-hole pair generation through backside silicon), 1340 nm laser (high resolution thermal probe, which allows localized heating), multiple tech- niques available (e.g. VBA, TIVA, SDL); photon emission microscopy, high sensitivity macro lens, high sensitivity detector (cooled CCD camera and InGaAs camera); SEM and EDS analysis, scanning acoustic microscope, PEM/