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edfas.org 49 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 4 (LCLS). Utilizing the whole breadth of these methods, scientists can explore very different, yet equally important aspects of speedy processes. Whileuserswill come fromaround the globeduring the coming months, the first experiment at the instrument is being done by a researcher who has been involved with MeV-UED since thebeginning, designing sample chambers for solid materials. Alexander Reid, a staff scientist at LCLS and the Stanford Institute for Materials and Energy Sciences (SIMES), is collecting this data. For more information, visit slac.stanford.edu. Pictorial representation of the SLAC electron camera.