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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 4 48 measurements. The camera’s image output can be win- dowed to increase frame update rates to 480 frames per second, enabling researchers to accurately characterize higher speed thermal events, helping to ensure that criti- cal data is captured during testing. and electronic systems industry. For more information, visit maserengineering.eu and PRODUCT NEWS CONTINUED FROM PAGE 46 Thermal images showing progression of heat dissipation from a 3D integrated circuit. For more information, visit flir.com . MIP MACHINE EXPANDS DECAPSULATION CAPABILITY FOR FAILURE ANALYSIS Maser Engineering, Enschede, the Netherlands, announces that is has further strengthened its capabilities in semiconductor failure analysis by acquiring a second microwave-induced-plasma (MIP) decapsulationmachine from Jiaco Instruments, also of the Netherlands. Jiaco Instrument’s MIP decapsulation system is a breakthrough innovation. Automated atmospheric pres- sure MIP decapsulation utilizes oxygen gas-only recipes. The systemhas beenproven for copper, palladium-copper, gold, and silver bond wires, and for advanced package types such as 3D, SiP, WLCSP, High Tg, Chip on Board, and BOAC. All have been processedwithout damage, ensuring reliable failure analysis and quality control. Maser, which has been operating a Jiaco MIP decap- sulation system since 2016, is an independent engineer- ing service company. Since 1993, it has offered reliability testing and failure analysis services to the semiconductor jiaco-instruments.com. ELECTRON CAMERA ENABLES ULTRAFAST SCIENCE Over the past few years, the U.S. Department of Energy’s SLACNational Accelerator Laboratory at Stanford University, Menlo Park, Calif., has developed a new tool to visualize physical and chemical processes with outstand- ing clarity: an ultra-high-speed electron camera capable of tracking atomic motions in a broad range of materials in real time. Starting in July of this year, the lab has made this tool available to researchers worldwide. The tool is an instrument for ultrafast electron dif- fraction (MeV-UED). It uses a beam of highly energetic electrons to probe matter and is especially useful for understanding atomic processes occurring on timescales as short as 100 femtoseconds, millionths of a billionth of a second. These rapid snapshots provide completely new insights into processes in nature and technology, benefit- ting applications inmaterials science, chemistry, biology, and other fields. The first proposal-driven experimental run of the MeV-UED instrument is scheduled throughDecember and will deliver powerful electron beams to 16 user groups from over 30 institutions. Experiments will initially focus on materials science and hot, dense states of matter. MeV-UED complements the lab’s suite of world-leading methods for studies of ultrafast science, including SLAC’s flagship x-ray laser, the Linac Coherent Light Source Maser Engineering’s decapsulation machines as installed.