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TIVA MEASUREMENTS WITH VISIBLE AND 1064-nm LASERS 4 DATA-DRIVEN RELIABILITY FOR DATACENTER HARD DISK DRIVES 16 FAILURE RISK ASSESSMENT OF LASER DIODE STACKS FOR A MARTIAN APPLICATION 22 MEASURING TEMPERATURE IN GaN HEMTs: AN APPROACH BASED ON RAMAN SPECTROSCOPY 10 MAY 2019 | VOLUME 21 | ISSUE 2 edfas.org A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS PAGES 38 & 39 THE POWER OF IC REVERSE ENGINEER ING FOR HARDWARE TRUST AND ASSURA NCE 30 EDFAS PHOTO & VIDEO CONTESTS An ASM Materials Solutions Publication