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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 56 Visit the Electronic Device Failure Analysis Society website edfas.org Accelerated Analysis...................................................... 56 Allied High Tech........................................................ 28-29 ASM International.....................................................37, 45 Checkpoint................................................................ 52-53 Hamamatsu. .................................................................... 9 Quantum Focus Instruments.......................................... 3 TESCAN USA Inc............................................................. 15 ULTRA TEC.................................. Inside front/back covers Zeiss.................................................... Outside back cover For advertising information and rates , contact: advertise@asminternational.org or call 400.338.5151. Current rate card may be viewed online at asminternational.org/mediakit. INDEX OF ADVERTISERS A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS Visit the Electronic Device Failure Analysis Society website edfas.org NANOTS 2019 The 39th annual NANO Testing Symposium (NANOTS 2019) will be held November 18-19 at KFC Hall, Kokusai Fashion Center, in Tokyo. NANOTS is one of the leading technical symposiums for discussing solutions that improve the testing process of nanoscale devices and materials. The two-day event will consist of a symposium with an invited talk, special session, technical sessions, commercial session, equipment exhibition, and evening session. Presentations on original, noncommercial, and nonpublishedworks are being solicited. Papers for the special session and technical sessions are peer-reviewed and selected based on a clear outline of problem, analysis, solution/results, and conclusion. NANOTS is sponsored by the Institute of NANO Testing in cooperation with the Institute of Electronics, Information and Communication Engineers, the Japan Society of Applied Physics, the Reliability Engineering Association of Japan, and the Union of Japanese Scientists and Engineers. For more information, visit the NANOTS website at www-nanots.ist.osaka-u.ac.jp/en. NOTEWORTHY NEWS