May_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 46 TRAINING CALENDAR LIFELONG LEARNING EDFAS believes in lifelong learning and supporting ourmembers and customers in that endeavor. Our goal is to provide a list of educational resources in failure analysis and related topics in each issue of EDFA magazine. In addition, explore all EDFAS has to offer from regional events, chapter courses, and tutorials and courses during ISTFA. Find out more by visiting edfas.org. Rose M. Ring, Lam Research rose.ring@lamresearch.com June 2019 EVENT DATE LOCATION 12th Annual FIB/SEM Meeting 5/6-7 Washington Contact: SEM FIB Users Group Artificial Intelligence in Wireless Networks 5/6-8 Amersfoort, the Netherlands Contact: CEI-Europe AB Semiconductor Reliability and Product Qualification 5/6-9 Munich Semiconductor Reliability and Product Qualification 5/13-16 Tel Aviv, Israel Contact: Semitracks Inc. Automated and Rapid Specimen Processing for Electron Microscopy Workshop 5/7-9 Hatfield, PA Contact: EMS Microscopy Academy International Conference on Electronics Technology (ICET) 5/10-13 Chengdu, China 69th Electronic Components and Technology Conference (ECTC) 5/25 Las Vegas Contact: IEEE Principles of Failure Analysis 5/20-23 Novelty, OH Contact: ASM International SMTA/MEPTEC Medical Electronics Symposium 5/21-22 Dallas Contact: SMTA May 2019 EVENT DATE LOCATION Introduction to SEM and EDS for the New SEM Operator 6/2 Bethlehem, PA Introduction to TEM (New course for 2019) 6/2 Bethlehem, PA Focused Ion Beam (FIB): Instrumentation and Applications 6/3-7 Bethlehem, PA Problem Solving: Interpretation and Analysis of SEM/EDS/ EBSD Data 6/3-7 Bethlehem, PA Quantitative X-ray Microanalysis: Problem Solving using EDS and WDS Techniques 6/3-7 Bethlehem, PA Scanning Electron Microscopy and X-ray Microanalysis 6/3-7 Bethlehem, PA Transmission Electron Microscopy 6/3-7 Bethlehem, PA Contact: Lehigh University Failure and Yield Analysis 6/3-6 San Jose, CA Introduction to Processing 6/3-4 San Jose, CA Advanced CMOS/ FinFET Fabrication 6/5 San Jose, CA Interconnect Process Integration 6/6 San Jose, CA Semiconductor Reliability and Product Qualification 6/10-13 San Jose, CA Contact: Semitracks Inc. RF Component and System Measurements 6/3-7 Dresden, Germany Contact: CEI-Europe AB