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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 40 DIRECTORY OF INDEPENDENT FA PROVIDERS Rose M. Ring, Lam Research rose.ring@lamresearch.com E lectronic companies of all types and sizes require failure analysis (FA) services. Our goal is to supply a resource of FA service providers for your reference files. The directory lists independent providers and their contact information, expertise, and types of technical services offered. ADVANCED MICROANALYTICAL 50A Northwestern Dr., Unit #4 Salem, NH 03079 877.605.6662 info@advancedmicroanalytical.com advancedmicroanalytical.com ServicesOffered: Comparative testing lab, compositional analysis, DPA (destructive physical analysis), engineering support, environmental monitoring, failure analysis, fire investigative/combustion byproduct, inspection services, integrated circuit support, materials characterization, nanomaterials, nondestructive testing, particle testing, particulate micro analysis (PMA), product development R&D, product/process validation, quality assurance, and unknown material identification. Tools and Techniques: CSAM, EBSD, EDS/elemental mapping, FIB-SEM, GC/GC-MS, GD-OES, hardness/micro- hardness testing, ICP-MS and ICP-OES, micro-FTIR, micro-Raman, NMR, optical microscopy, particle size distribution, physical/mechanical testing, SEM, surface profiling, TEM, XPS (x-ray photoelectron spectroscopy), x-ray imaging/3D x-ray CT, XRD, and XRF. ANALYTICAL ANSWERS INC. 4 Arrow Dr. Woburn, MA 01801 781.938.0300 answers@analyticalanswersinc.com analyticalanswersinc.com/capabilities Services Offered: Quality assurance, failure analysis, analytical chemistry and instrumentation, materials characterization, biomaterials, medical device analysis, geological materials, microscopy (OM, SEM, TEM), and spectroscopy. Tools and Techniques: SAM, variable pressure scanning electronmicroscopy, FIB, electron spectroscopy for chemi- cal analysis, thermal analysis, visible light microscopy (OM/PLM), XM, FTIRI, FTIR, EDS, wavelength dispersive spectroscopy, TEM, and SEM. COVALENT METROLOGY 921 Thompson Place Sunnyvale, CA 94085 408.621.0147 roger@covalentmetrology.com smtanalytical.com/index.html Services Offered: Analytical techniques, failure analysis, metrology services, board cleanliness testing, onsite train- ing for laboratory techniques and IPC certification, and IPC compliance testing. Tools and Techniques: Cross-sectioning, dye and pry testing, optical microscopy, SEM/EDX, high resolution x-ray imaging, ion chromatography, decapsulation, FTIR, acoustic imaging, and strain gauge testing. DELTA — A PART OF FORCE TECHNOLOGY DELTA—Denmark Venlighedsvej 4 2970 Hørsholm Denmark +45 72 19 40 40 asic@delta.dk DELTA Microelectronics Ltd.—United Kingdom Tredomen Innovation and Technology Centre Ystrad Mynach Hengoed CF82 7FQ United Kingdom +44 1443 866322 enquiries@delta-asic.co.uk asic.madebydelta.com/about/contact/ ServicesOffered: ASICdesign, ASICmanufacturing, wafer supply, semiconductor testing, IC packaging, IC testing, failure analysis, and supply chain. Tools and Techniques: Microsectioning, real-time x-ray, hot spot analysis, solderability tests, submicron probing, chemical and plasma etching, SEM, SAM, EDAX, gross and fine leak hermeticity testing, bright/dark field, differential interference, light sectioning, stereo microscopy, and environmental testing (temperature, shock, humidity, corrosion, and vibration). ECR LABORATORY INC. 916 Commercial St. Palo Alto, CA 94303 408.727.5100 info@ecrlab.com ecrlab.com Services Offered: Electronic failure analysis, destructive physical analysis and construction analysis (MIL-STD- 1580, SSQ25000, PEM-INST-001, ANSI/EIA-469, GSFC- S-311-M-70, or any other applicable standard), and