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edfas.org 27 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 ACKNOWLEDGMENTS This article is based on the oral presentation, “Etude de Robustesse du Stack de Diodes Laser pour Application Martienne” by Guillaume Thin (Intraspec Technologies), Frédéric Bourchier (CNES), and Hervé Moisan (Lumibird), which was presented at the 16th ANADEF Workshop, June 5-8, 2018, in Seignosse, France. REFERENCES 1. M. Silver, et al.: “Theoretical and Experimental Study of Improved Catastrophic Optical Damage Performance in 830 nm High Power Lasers with Non-Absorbing Mirror,” CMX2, CLEO, 2005, p. 414. 2. R.E. Mallard: “Failure Analysis of High Power GaAs-Based Lasers,” J. Vac. Sci. Technol. A, 1998, 16 (2). ABOUT THE AUTHORS Guillaume Thin received a masters degree in materials science for electronics and a Ph.D. in automotive optoelectronics reliability fromtheUniversity of Paris-Saclay. Heworked at Valeo Lighting Systems for five years as a light source technologist for the development of advanced automotive lighting projects in Paris. He is author or co-author of 21 patents. Since 2017, Thin has held the posi- tion of failure analysis engineer at Intraspec Technologies in Toulouse, France, and is in charge of optoelectronic components. Frédéric Bourcier is a graduate of Brevet de Technicien Supérieur (BTS) in photonics (1994) and ENSSAT (Ecole Superieure des Sciences Appliquees et Technologies) Lannion in optronic engineering (2010). He was responsible for the LIDAR experiment in Antarctica in 1995 for 14 months. Afterward, he was hired at Centre National d’Etudes Spatiales (CNES) and spent 10 years in the optics department. In 2006, he moved to the expertise laboratory. Hervé Moisan has a masters degree in physics (1989), and an engineering degree in the same discipline (1991). In 1994, he received his Ph.D. in optics and optoelectronics from the Polytechnic National Institute of Grenoble. Heworked for Thales Central Research Lab from1995 to 2000 inmaterials and technology for optoelectronics. Hemoved to HPLDManufacturing at Thales Laser Diode in 2000 and then to Quantel/Lumibird in 2007where he is currently head of research and development on laser diodes. ITC 2019 The International Test Conference (ITC) will be held November 12-14 at theWashington Marriott Wardman Park, in D.C. ITC is the world’s premier conference dedicated to the elec- tronic test of devices, boards, and systems covering the complete cycle fromdesign verifica- tion, test, diagnosis, failure analysis, and back to process and design improvement. At ITC, test and design professionals will confront the challenges the industry faces and learn how these issues are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. ITC, the cornerstone of TestWeek events, offers awide variety of technical activities targeted at test and design theoreti- cians and practitioners. The conference includes formal paper sessions, tutorials, panel sessions, case studies, a lecture series, commercial exhibits and presentations, and a host of ancillary professional meetings. ITC is sponsored by the IEEE. For more information, visit itctestweek.org . NOTEWORTHY NEWS