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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 2 22 FAILURE RISK ASSESSMENT OF LASER DIODE STACKS FOR A MARTIAN APPLICATION Guillaume Thin, Intraspec Technologies, Toulouse, France Frédéric Bourcier, CNES, Toulouse, France Hervé Moisan, Lumibird, Les Ulis, France guillaume.thin@intraspec.com EDFAAO (2019) 2:22-27 1537-0755/$19.00 ©ASM International ® INTRODUCTION Sending a component into space for a scientific mission requires a slightly different approach for qualifi- cation than for ground applications. Indeed, throughout qualification there are not enough samples available to allow statistical testing due to the exceptionally high sample cost. Typically, only one specimen—or a fewpieces at most—are used during testing, yet the entire mission relies on each component. In addition, optical elements cannot be designed with redundant paths. However, it is clear that reliability and resilience are critically important in these conditions. Custom components, specific appli- cations, and exotic missions require that norms related to qualification and reliability are adapted, and that risk analysis is primarily based on expertise. The laser diode stack investigated here is a custom la- ser source for optical pumping of the laser induced break- downspectroscopy(LIBS)instrumentdesignedfortherover used in theMars Curiositymission (Fig. 1). For thismission, the qualificationprocess of the component was tailored in terms of consequence. This article describes the compo- nent characteristics and the results of the construction analysis led in partnership with the component supplier (Lumibird) and CNES experts. It also reviews the catastro- phic optical damage (COD) effect resulting from an unexpected but timely failure of a test bench during quali- fication and the following resilience of the component. COMPONENT DESCRIPTION The laser diode stack is employed as the optical pump- ing source for the SuperCam LIBS instrument (Fig. 2). Fig. 1 Curiosity mission rover and its SuperCam instrument (head of the rover).