February_EDFA_Digital

A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS FEBRUARY 2019 | VOLUME 21 | ISSUE 1 edfas.org MACHINE LEARNING INSIDE THE CELL TO SOLVE COMPLEX FINFET DEFECT MECHANISMS 4 ENSURING ADVANCED SEMICO NDUCTOR DEVICE RELIABILITY USING FA A ND SUBMICRON DEFECT DETECTIO N 20 FUSE BURNOUT DUE TO GATE DR IVE CIRCUIT PARASITIC RINGING IN DC/DC CONVERTERS 26 AN AUTOMATED METHODOLOGY FOR LOGIC CHARACTERIZATION VEHICLE DESIGN 12 AN D THE W INNER IS...