February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 56 Visit the Electronic Device Failure Analysis Society website edfas.org Accelerated Analysis...................................................... 56 Allied High Tech........................................................ 28-29 ASM International.......................................................... 35 Checkpoint................................................................ 42-43 Hamamatsu. .................................................................. 11 Quantum Focus Instruments.......................................... 3 TESCAN USA Inc............................................................. 15 ULTRA TEC.................................. Inside front/back covers Zeiss.................................................... Outside back cover For advertising information and rates , contact: Erik Klingerman, National Account Manager; 440.840.9826; Erik.Klingerman@asminternational.org. Current rate card may be viewed online at asminternational.org/mediakit. INDEX OF ADVERTISERS A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis, contact Erik Klingerman, National Account Manager; 440.840.9826; Erik.Klingerman@asminternational.org. Current rate card may be viewed online at asminternational.org/mediakit. IPFA 2019 The 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2019) will be held July 2-5 in Hangzhou, China. The event will be devoted to the fundamental understanding of the physical mechanisms governing reliability and failure in a large variety of advanced semiconductor devices and the electrical-physical failure analysis techniques, test methodologies, reliability models, simulations, and characterization tools that could be used to reliably identify the root cause of failure and the lifetime of these devices under different stress regimes. The symposium is technically cosponsored by the IEEE Electron Device Society and IEEE Reliability Society. For more information, visit the IPFA website at ipfa-ieee.org . NOTEWORTHY NEWS