February_EDFA_Digital

edfas.org 53 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 Visit the Electronic Device Failure Analysis Society website edfas.org Contact Information ASM International 800.336.5152 MemberServiceCenter@asminternational.org asminternational.org ASMC 408.943.6900 semihq@semi.org semi.org CEI-Europe AB +46.13.100.730 eci@cei.se www.cei.se Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN 2019) 530.896.0477 della@avs.org www2.avs.org/conferences/FCMN IRPS 732.562.6359 IRPSplanners@ieee.org irps.org McCrone Group 630.887.7100 mccrone.com Semitracks Inc. 505.858.0454 info@semitracks.com semitracks.com SMTA 952.920.7682 smta@smta.org smta.org May 2019 EVENT DATE LOCATION Introduction to Metallurgical Lab Practices 5/6-8 Novelty, OH Contact: ASM International Advanced Semiconductor Manufacturing Conference (ASMC) 5/6-9 Saratoga Springs, NY Contact: ASMC 2019 Semiconductor Reliability/Product Qualification 5/6-9 Uppsala, Sweden Semiconductor Reliability/Product Qualification 5/13-16 Tel Aviv, Israel Contact: Semitracks Inc. Thin Film Deposition at the Nanoscale: Mechanisms and Applications 5/6-10 Uppsala, Sweden Silicon-on-Insulator Technologies from Microelectronics to MEMS 5/8-10 Amersfoort, the Netherlands Contact: CEI-EU EVENT DATE LOCATION Basic Microscopy 5/13 Westmont, IL Sample Preparation Techniques 5/14-16 Westmont, IL Contact: McCrone Group Medical Electronics Symposium 5/21-22 Elyria, OH Contact: SMTA