February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 50 PRODUCT NEWS Ted Kolasa, Northrop Grumman ted.kolasa@gmail.com PRESS RELEASE SUBMISSIONS: MAGAZINES@ASMINTERNATIONAL.ORG BRUKER LAUNCHES NEW FAMILY OF SCANNING PROBE MICROSCOPES Bruker, Tucson, Ariz., announces the release of the Dimension XR family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA). Building on two of the most common AFM plat- forms in scientific publications, the Icon and FastScan, Dimension XR SPMs are available in three configurations optimized for nanoelectrical, nanomechanics, and nano- electrochemical applications. These systems significantly expand researchers’ ability toquantifymaterial properties at the nanoscale. Bruker’s Dimension XR systems are available on either the Icon or FastScan AFM platform and feature three configurations that provide exceptional characterization: The Nanomechanics configuration combines AFM-nDMA, PeakForce QNM, FASTForce Volume, and FASTForce Volume CRmodes to rapidly and quantitatively character- izematerials for their nanomechanical characteristics; the Nanoelectrical configuration includes PeakForce TUNA, PeakForce KPFM, and DataCube modes for a complete array of electrical AFM techniques within one system; and the NanoEC configuration utilizes unique nanoelectrode probes with EC-AFM and PeakForce SECM modes to perform in situ topography scans in the electrochemi- cal environment for real-time quantitative analysis of nanoscale local reactivity. For more information, visit bruker.com . COVALENT METROLOGY PARTNERS WITH RIGAKU CORP. Covalent Metrology, Sunnyvale, Calif., recently announced a newpartnershipwith Rigaku Corp. In a joint declaration, Covalent and Rigaku revealed a collabora- tion agreement demonstrating mutual commitment to support American high-tech industries with the most advanced metrology capabilities available. Under the terms of this agreement, Rigaku will supply Covalent with several state-of-the-art instruments for its new facility in Sunnyvale. The new partnership provides Covalent with exceptional analytical service capabilities and Rigaku with a North American demonstration facility in Silicon Valley. The Rigaku Semiconductor Metrology Division designs andmanufactures x-raybasedmeasurement tools to solve semiconductor manufacturing challenges. With over 35 years of global experience in the semiconductor industry, Rigaku metrology tools employ x-ray fluorescence (XRF), x-ray diffraction (XRD), x-ray reflectometry (XRR), and critical-dimension small-angle x-ray scattering (CD-SAXS) techniques, enabling everything from in-fab process control metrology to R&D for thin film and materials characterization. Covalent Metrology provides imaging and charac- terization services to support R&D, defect analysis, and quality control for companies in the semiconductor, solar, medical device, and MEMS industries, among others. For more information, visit covalentmetrology.com and rigaku.com . UV CURED ADHESIVE FEATURES HIGH GLASS TRANSITION TEMPERATURE Master Bond, Hackensack, N.J., announcesEP17HTND- CCM, a new single component epoxy that is not premixed or frozen. It ismore convenient to handle, apply, and store Bruker Dimension XR scanning probe microscope.