February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 46 T he ASM Electronic Device Failure Analysis Society established two awards to recognize the accom- plishments of its members. The 2018 awards were presented at ISTFA 2018 in Phoenix during the October 29th Opening Session and EDFAS General Mem- bership Meeting. A packed room of attendees saw two longstanding members receive recognition for their decades of dedicated service to the Society, hopefully inspiring others to step up their volunteer efforts as well. I am pleased to highlight the 2018 winners. The EDFAS Lifetime Achievement Award recognizes thosewho have given their time, knowledge, and abilities toward the advancement of the electronic device failure analysis industry. The 2018 awardee is Edward Cole, Jr., FASM, senior fellow at Sandia National Laboratories. His citation reads: “For his development and imple- mentation of microelectronics defect localization tools to enhance advancement of integrated circuits, and his 2018 EDFAS AWARD WINNERS EDFAS AWARD WINNERS: RECOGNIZING PIONEERS AND EDUCATORS Zhiyong Wang, Chair, EDFAS Awards and Nominations Committee Past President, EDFAS zhiyong.wang@maximintegrated.com commitment to education and mentoring in the failure analysis community.” As a founding member of EDFAS, Cole has served in numerous roles contributing significantly to the success of the Society and its impact on the larger microelectron- ics failure analysis community. As past general chair and frequent presenter, he has received the ISTFA Best Paper Awardmultiple times. He continues to contribute to ISTFA as a paper mentor, reviewer, and tutorial presenter. One of the founding editors of the EDFA publication, Cole still serves on its editorial board after 20 years and counting. He has developed several FA techniques that revolution- ized how laser and electron beams are used for defect localization. Several companies commercialized his patented methods, resulting in an industry-wide ability to locate defects that were previously impossible to find. And his impact in the semiconductor community extends beyond failure analysis. Ed Cole receives the 2018 EDFAS Lifetime Achievement Award from EDFAS President Lee Knauss. EDFAS President Lee Knauss presents the 2018 EDFAS President’s Award to Christian Boit.