February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 34 Congratulations to the following winners: ISTFA 2018 BEST PAPER: “Scan Chain Fault Isolation using Single Event Upsets Induced by a Picosecond 1064 nm Laser” (Emerging FA Techniques and Concepts session) Keith Serrels, NXP Semiconductor ISTFA 2018 OUTSTANDING PAPER: “Power Device Burned Completely – And Now, How to Find the Root Cause?” (Board and System Level FA session) Peter Jacob, EMPA ISTFA 2018 ATTENDEES’ BEST PAPER: “Asymmetric Data – FrequencyMapping andMulti Trigger – Probing for Improved Scan Debug” (Product Yield, Test and Diagnostics session) Eli Abu Ayob, Intel ISTFA 2018 BEST STUDENT PAPER: “Pattern Search Automation for Combinational Logic Analysis” (Emerging FA Techniques and Concepts session) Venkat Ravikumar, Advanced Micro Devices ISTFA 2018 BEST POSTER: “Advanced T-LSIM System Detections using Amplified External Isolated Source-Sense Unit” Zhi Jie Lau, ON Semiconductor ISTFA 2018 OUTSTANDING POSTER: “OBIRCH for Isolating High- and Low-Resistance Test Structure Failures during Sub-14 nm Technology Devel- opment” Felix Beaudoin, GlobalFoundries Inc. EDFAS 2018 PHOTO CONTEST WINNERS Congratulations to the following winners: Category I: Color Images 1st Tim Hazeldine, Ultra Tec 2nd Luigi Aranda, Raytheon Failure Analysis Lab 3rd KrizalynOligario, Analog Devices Philippines Inc. Category II: Black & White Images 1st Lori Sarnecki, ON Semiconductor 2nd Carlos R. Cuellar, Raytheon Space and Airborne Systems 3rd Melissa Caseria, Analog Devices Philippines Inc. Category III: False Color Images 1st Wentao Qin, ON Semiconductor All winners received a recognition plaque or certificate and a one-year ASM/EDFASmembership. Winning entries will be featured on the cover of thismagazine during 2019 and also may be viewed on the EDFAS website. EDFAS 2018 VIDEO CONTEST WINNER Congratulations to the following winner: “Seeing is Believing” Sandeep Kullar, Nordson Dage The winner received 50% off conference registration to a future ISTFA conference and a first-place plaque. The winning entry may be viewed on the ISTFA 2019 website. ISTFA SPONSORS & SUPPORTERS On behalf of the Electronic Device Failure Analysis Society (EDFAS) and the organizers of ISTFA 2018, we appreciate your generous sponsorship contribution and recognize your continued commitment in making the ISTFA Conference and Exposition an outstanding event! Sponsors Allied High Tech Products, Inc. BSET EQ Mager Scientific, Inc. Mentor, A Siemens Business Nanotronics Quartz Imaging Corp. SEMICAPS Thermo Fisher Scientific (formerly FEI) ULTRA TEC Varioscale Inc. Corporate Supporter MESOSCOPE Technology Co., Ltd. Media Sponsors EDFA eNews EDFA Magazine