February_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 21 NO. 1 2 PURPOSE: To provide a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers. Felix Beaudoin Editor/GlobalFoundries; felix.beaudoin@ globalfoundries.com Scott D. Henry Publisher Mary Anne Fleming Manager, Technical Journals Kelly Sukol Production Supervisor Joanne Miller Managing Editor ASSOCIATE EDITORS Nicholas Antoniou Nova Measuring Instruments Navid Asadi University of Florida Guillaume Bascoul CNES France Michael R. Bruce Consultant David L. Burgess Accelerated Analysis Jiann Min Chin Advanced Micro Devices Singapore Edward I. Cole, Jr. Sandia National Labs Szu Huat Goh GlobalFoundries Singapore Martin Keim Mentor, A Siemens Business Ted Kolasa Orbital ATK Rose M. Ring Lam Research Sam Subramanian NXP Semiconductors Paiboon Tangyunyong Sandia National Labs David P. Vallett PeakSource Analytical LLC Martin Versen University of Applied Sciences Rosenheim, Germany FOUNDING EDITORS Edward I. Cole, Jr. Sandia National Labs Lawrence C. Wagner LWSN Consulting Inc. GRAPHIC DESIGN Jan Nejedlik, designbyj.com PRESS RELEASE SUBMISSIONS magazines@asminternational.org Electronic Device Failure Analysis™ (ISSN 1537-0755) is pub- lished quarterly by ASM International ® , 9639 Kinsman Road, Materials Park, OH 44073; tel: 800.336.5152; website: edfas. org.Copyright©2019byASMInternational.Receive Electronic Device Failure Analysis as part of your EDFAS membership. Non-member subscription rate is $150 U.S. per year. Authorizationtophotocopy itemsfor internalorpersonaluse, orthe internalorpersonaluseofspecificclients, isgrantedby ASM Internationalfor librariesandotherusersregisteredwith theCopyrightClearanceCenter(CCC)TransactionalReporting Service, provided that the base fee of $19 per article is paid directlytoCCC,222RosewoodDrive,Danvers,MA01923,USA. Electronic Device Failure Analysis is indexed or abstracted by Compendex, EBSCO, Gale, and ProQuest. I t is my pleasure and privilege to recognize one of the founders of what EDFAS has been and has become. Lawrence C. Wagner, FASM, will be leaving the EDFA Editorial Board with this issue, and the rest of the board thought his contri- butions should be celebrated. Larry has been a member of the EDFA board since its inception in 1998, but he has meant so much more to EDFAS and to EDFA magazine. Larry was the first president of EDFAS with its founding in 1998. He later became the first EDFAS member to serve as an ASM trustee. He was also the first EDFASmember to become president of ASMand the first EDFASmember to become an ASM Fellow. Back in 1998, he was the first editor of Electronic DeviceFailureAnalysisNews ( EDFAN ). EDFAN was a two-color, 32-pagequarterly newsletter serving the EDFAS community and was the predecessor to EDFA magazine. Larry has served on the editorial board since 1998 and now after 20 years—at the completion of 20 volumes—is stepping down. Larry was the lead editor in the early stages and he organized and led a four-person editorial board. As with much of his EDFAS volunteerism, the newsletter was a concept Larry was able to shep- herd from a vision to a reality. He was always looking forward. He let that early board know that it was straightforward to produce three to four issues of a newsletter. The challenge was keeping content flowing for the next year, and the next year, and the year after that. This kindof continuity comes from leaders who are willing to make long-term commitments. Larry’s 20 years with the publication shows what leading by example is all about. A reader survey in the early years showed that the EDFAS community wanted a broader range of content including case histories, conference infor- mation, diversity of articles, and other FA resources. As the newsletter grew in content, a decisionwasmade in 2002 tomove to amagazine format with a two-color interior and four-color covers. The business case for the jumphad to be vetted with both EDFAS and ASM. This was not easy, but Larry stewarded a successful transition. FEBRUARY 2019 | VOLUME 21 | ISSUE 1 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS GUEST EDITORIAL A TRIBUTE TO LARRY WAGNER Edward I. Cole, Jr., FASM, Sandia National Labs coleei@sandia.gov edfas.org (continued on page 10) Larry Wagner helps guide discussions at an ASM strategic planning session in Seattle in 2006.