February_EDFA_Digital

A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS FEBRUARY 2019 | VOLUME 21 | ISSUE 1 edfas.org MACHINE LEARNING INSIDE THE CELL TO SOLVE COMPLEX FINFET DEFECT MECHANISMS 4 ENSURING ADVANCED SEMICONDUCTOR DEVICE RELIABILITY USING FA AND SUBMICRON DEFECT DETECTION 20 FUSE BURNOUT DUE TO GATE DRIVE CIRCUIT PARASITIC RINGING IN DC/DC CONVERTERS 26 AN AUTOMATED METHODOLOGY FOR LOGIC CHARACTERIZATION VEHICLE DESIGN 12 AND THE WINNER IS...