November_EDFA_Digital

edfas.org 47 ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 4 Visit these key exhibitors and more at ISTFA ’17 in the Exhibit Hall of the Pasadena Convention Center in Pasadena, Calif. Exhibition dates and times* Tuesday, November 7 Show hours: 9 a.m. – 6:30 p.m. Networking reception: 5 – 6:30 p.m. Wednesday, November 8 Show hours: 9:30 a.m. – 3:30 p.m. Dessert reception: 1:30 – 3:30 p.m. *Times are subject to change XEI Scientific, Inc. is the world leader in remote plasma cleaning of hydrocarbon contamination in vacuum chambers. The Evactron Plasma De-Contaminator uses a unique, energy-efficient RF plasma source to generate oxygen radicals plus UV from nitrogen metastables for dual-action removal of adventitious carbon. Evactron plasma cleaners operate at RP, TMP, and VHV levels for in situ cleaning of EUV and x-ray optics as well as SEM, FIB, and TEM samples. The Evactron De-Contaminator can be installed on most vacuum chambers and electron microscopes. Reach base pressure faster, increase daily throughput, and obtain better analytical data with Evactron plasma cleaning. evactron.com XEI SCIENTIFIC, INC. ALLIED HIGH TECH PRODUCTS, INC. BOOTH 507 BOOTH 715 The Tessent Diagnosis software accelerates defect localization in digital semiconductor devices. With layout-aware and cell-aware technology, interconnect as well as transistor-level defects can be precisely identified based on manufacturing test fail data. Tessent SiliconInsight makes silicon diagnosis even more accessible, enabling bench-top test, characterization, and diagnosis of ATPG-, compression-, and BIST-tested circuits. mentor.com MENTOR, A SIEMENS BUSINESS Software for a FASTER SMARTER Lab! • FA-LIMS: The only laboratory information management system built specifically for failure analysis and materials characterization labs. Configured to match your specific workflow and terminology requirements. Improve lab productivity and efficiency! • RE-LIMS: For reliability and quality assurance labs. Generate qual plans quickly, track all times and results, manage priorities and resources. Interfaces with FA-LIMS. • PCI-AM (Automated Measurement of Semiconductor Features) Version 5.0: This module for Quartz PCI provides automated measurement features for engineers who measure different types of semiconductor device features. Now you can fully characterize a folder of images with a single click! quartzimaging.com QUARTZ IMAGING CORPORATION BOOTH 607 BOOTH 721 For over 34 years, Allied High Tech Products has provided sample preparation products for microscopic evaluation to the microelectronics industry. Allied manufactures state-of-the-art equipment at its California headquarters, and all design, manufacturing, and assembly takes place in-house to ensure the highest-quality equipment is produced. Items on display include Allied’s state- of-the-art X-Prep® Precision Polishing/ Grinding/Milling Machine, MultiPrep™ Polishing System, TechCut™ Sectioning Saws, and Zeiss microscopes. A range of consumable products will also be shown. alliedhightech.com ISTFA 2017 EXHIBITORS SHOWCASE