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edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 4 20 ABOUT THE AUTHORS Oskar Amster has 20 years of experience working with analytical instruments and metrology tools. His background is in applications development, strategic marketing, and product develop- ment. He has extensive experience working in atomic forcemicroscopy, stylus profilers, and optical profiler instruments. Prior to joining PrimeNano, Inc., Oskar was Product Marketing Manager at KLA-Tencor and held positions at Ambios Technology, Ametek Taylor Hobson, Multiprobe, Micron Force Instruments, and Topometrix. He has an M.S. in materials engineering and a B.S. in physics from California Polytechnic State University, San Luis Obispo. Stuart Friedman has engaged in academic and industrial research in a variety of areas, including image processing, surface science, electron optics, bio-medical instrumen- tation, and bio-physical simulation. He currently serves as Chief Technology Officer of PrimeNano, Inc., a Silicon Valley instrumentation startup focused on commercial implementation of scanning microwave impedance microscopy for research and commercial applications. Before co-founding PrimeNano, Dr. Friedman founded and led a research and development and systems engineering consulting firm in Silicon Valley, helping transition complex systems to commercial reality for startups as well as Fortune 500 clients. Prior to that, he held research and development, systems architecture, and technical leadership roles at Gatan, Inc., Etec Systems, KLA-Tencor, MDS Sciex, and Signature Bioscience. Dr. Friedman holds a Ph.D. in applied physics from Stanford University, an M.Phil. in physics from Cambridge University, and a B.S.E. in engineering physics from Cornell University. Yongliang Yang has been conducting research on scanning probe microscopy technology for the past five years. He has also spent more than 10 years doing research on MEMS devices. Before joining PrimeNano, Inc. in 2014 as a research and development scientist, Dr. Yang was a postdoc- toral student at StanfordUniversity, developing scanningmicrowave impedancemicroscopy (sMIM) technology and studying electrical properties of materialswith sMIM. Dr. Yang has a B.S. degree from Peking University and a Ph.D. from the Chinese Academy of Sciences. He holds four patents and is the author of more than 40 publications. Fred Stanke has done research and development of metrology and inspec- tion systems for a wide range of applications. For his Ph.D. dissertation at Stanford University, he developedultrasonicmetrology tonondestructivelymeasure the grain sizes ofmetals. He did research with Schlumberger Limited on using ultrasound to inspect oil well casings for their capability to provide hydraulic isolation. At the startup Sensys Instruments, Dr. Stanke headed the technical team to develop an optical system using scatterometry to measure the critical dimensions of integrated circuits. He accompanied that product when Tokyo Electron Limited bought it to integrate into semi- conductor clean tracks to improve and shorten the control loop for microlithography. At PrimeNano Inc., Dr. Stanke does research and development to allow scanning microwave impedance measurements to quantify properties such as the doping concentrations of semiconductors. NANOSCALE CAPACITANCE AND CAPACITANCE-VOLTAGE CURVES (continued from page 18) Advertise in Electronic Device Failure Analysis magazine! For information about advertising in Electronic Device Failure Analysis , contact Erik Klingerman, National Account Manager; tel: 440.840.9826; e-mail: Erik.Klingerman@asminternational.org . Current rate card may be viewed online at asminternational.org/mediakit.