November_EDFA_Digital

edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 19 NO. 4 2 PURPOSE: To provide a technical condensation of information of interest to electronic device failure analysis technicians, engineers, and managers. Felix Beaudoin E ditor/GLOBALFOUNDRIES; felix.beaudoin@ globalfoundries.com Scott D. Henry Publisher Mary Anne Fleming Manager, Technical Journals Kelly Sukol Production Supervisor Liz Marquard Managing Editor ASSOCIATE EDITORS Nicholas Antoniou Revera, Inc. Michael R. Bruce Consultant David L. Burgess Accelerated Analysis Jiann Min Chin Advanced Micro Devices Singapore Edward I. Cole, Jr. Sandia National Labs James J. Demarest IBM Szu Huat Goh GLOBALFOUNDRIES Singapore Ted Kolasa Orbital ATK Andreas Meyer GLOBALFOUNDRIES Philippe H.G. Perdu CNES France Rose M. Ring Qorvo, Inc. Paiboon Tangyunyong Sandia National Labs David P. Vallett PeakSource Analytical, LLC E. Jan Vardaman TechSearch International, Inc. Martin Versen University of Applied Sciences Rosenheim, Germany Lawrence C. Wagner LWSN Consulting Inc. GRAPHIC DESIGN Janet Nejedlik - designbyj.com PRESS RELEASE SUBMISSIONS magazines@asminternational.org Electronic Device Failure Analysis™ (ISSN 1537-0755) is pub- lished quarterly by ASM International ® , 9639 Kinsman Road, Materials Park, OH 44073; tel: 800.336.5152; website: edfas. org.Copyright©2017byASM International.Receive Electronic Device Failure Analysis as part of your EDFAS membership of $88 U.S. per year. Non-member subscription rate is $135 U.S. per year. Authorizationtophotocopy itemsfor internalorpersonaluse, orthe internalorpersonaluseofspecificclients, isgrantedby ASM Internationalfor librariesandotherusersregisteredwith theCopyrightClearanceCenter(CCC)TransactionalReporting Service, provided that the base fee of $19 per article is paid directlytoCCC,222RosewoodDrive,Danvers,MA01923,USA. Electronic Device Failure Analysis is indexed or abstracted by Compendex, EBSCO, Gale, and ProQuest. S triving for 100% Success Rate” is the theme of the 2017 International Symposium for Testing and Failure Analysis (ISTFA). If you attend the conference, you will certainly find the keys to success by joining the many planned technical sessions, users’ groups, panel discussion, keynote presentation, andby exchangingwith your peers. This year I have the privilege to act as the Technical Program Chair, and I assure you the conference will deliver on the technical quality, thanks to the dedication of all the volunteers on the ISTFA Organizing Committee. To the 100+ technical chairs, co-chairs, and reviewers who spent endless hours diligently mentoring oral and poster manuscripts, THANK YOU! Success can be defined and measured in several ways. The panel discus- sion on the conference themewill surely debate questions such as: What does 100% success rate really mean to your organization? How best to overcome challenges in order to achieve success? As an individual contributor, I have the firm belief that success in our field of electronic device failure analysis can only be achieved by developing broad interdisciplinary scientific and technological knowledge. Peer mentoring, technical conferences, tutorials, short courses, and publications are all sources of information that are part of the EDFAS Society’s mission to foster education and communication in the failure analysis community, which is, of course, powered by volunteers. Inparticular, EDFA magazine relies on its volunteer Associate Editors, listed on page 2, to recruit and mentor technical contributions, write the various informative departments, and seek out guest editorials and columnists from experts worldwide. I would like to recognize James J. Demarest, who will be retiring from the EDFA Editorial Board. Hismainmotive in stepping aside is to make way for new volunteers, fostering the growth of the magazine through fresh opportunities to serve. His expertise will be deeply missed. EDFA magazine, and more generally our EDFAS Society, can only thrive with the help of volunteers like you. Please consider contributing technical articles to share your knowledge. New communication and social media tools now establish virtual content and help reach a broader audience who are dealing with failure of electronic devices in emerging application fields. We need help to create content for those new platforms. If you attend the conference, do not hesitate to stop me or any of the EDFAS Board members and Technical Session Chairs to introduce yourself and discuss your interests. Ready to get involved? Please contact me or Sweta Pendyala, the Volun- teer Committee Chair, at sweta.pendyala@globalfoundries.com . EDFAS can be “Striving for 100% Success Rate” only with volunteers like you!!! NOVEMBER 2017 | VOLUME 19 | ISSUE 4 A RESOURCE FOR TECHNICAL INFORMATION AND INDUSTRY DEVELOPMENTS ELECTRONIC DEVICE FAILURE ANALYSIS EDITORIAL EDFAS SUCCESS THROUGH VOLUNTEERS! Felix Beaudoin, Editor GLOBALFOUNDRIES felix.beaudoin@globalfoundries.com “