edfas.org ELECTRONIC DEVICE FAILURE ANALYSIS | VOLUME 28 NO. 2 34 test. During validation testing to emulate real-world user interactions (such as hot-plugging), a –2kV pulse was applied to the data line of USB2 Lane 4 (Fig. 3). The challenge was to transition from a “black box” functional failure to a specific physical location on the die. The following sections detail the systematic workflow employed to isolate the defect (Fig. 4). Fig. 3 USB controller board, with onboard protections being zapped with ESD gun. Fig. 4 Typical ESD fault isolation and fault analysis flow.[2] (continued on page 36)
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